The Structural Characterizations of Polymethel(Methaacrylate) Doped Nanoparticle Metal (Cu,Co,Fe) Thin Film by Using Nd-Yag Laser Ablation (Published)
The structural properties of PMMA doped with ( Cu , Co , Fe ) nanoparticls prepared by laser ablation were studied . In this research the polymethyl mehtacrylate (PMMA) was dissolved in chloroform with (5%) concentration to form homogeneous solution. PMMA doped with (Cu ,Fe ,and Co ( nanoparticale (NPs) prepared by Nd-Yag(532nm) laser ablation. The X-ray diffraction shows that the structure of pure polymer film have an amorphous nature, but PMMA doped with (Cu , Co , Fe) nanoparticles are polycrystalline structure. The results indicate that there are a shifting and reduction in positions of peak intensity as compared with the pure (Cu , Co ,Fe) nanoparticles and there are generated some new peaks appear. The AFM examination reveal to reduction in average nanoparticle diameter after doping with NPs metal (Cu , Co , Fe ) . The FT-IR examination appear some transmittance band after doping with NPs metal (Cu , Co , Fe )
Keywords: Afm, Cobalt, Copper, Crystal Size, Doping, FTIR, Iron, Nanoparticle, Polymethyl Mehtacrylate (Pmma), Xrd
Effects of Environmental , Alpha and Beta Particles on Lightly Doped p-n Junction Germanium films (Review Completed - Accepted)
The lightly aluminum and arsenic doped germanium films were prepared using thermal co-evaporation process to deposit p-n film junctions with (0.1wt%) concentration. The prepared films were exposed to circumstance and natural radionuclide (Ra226) emitted alpha and (Sr90) emitted beta particles after heat treatment with various dosages .The J-V characteristics refer to shifting in both forward and reverse bias and lead to increase in resistivity, initial and final threshold voltages, resistivity variation percentage, but damage percentages decreases after every stages of exposure. Also the change of current per unit volume increase with environmental exposure and fluency.
Keywords: Alpha Particle, Beta Particle, Doping, Environment, Semiconductors, Thermal Evaporation P-N Junction., Thin Film