Using the nonparametric “kernel methods” of curve fitting, a new approach is
taken for testing exponentiality versus net decreasing variance residual lifetime
(NDVRL). The test is proposed for complete and censored data. The Pitman’s asymptotic
relative efficiency to test for other classes is discussed. Selected critical values are
tabulated. Some numerical simulations on the power estimates are presented for the
proposed test. Numerical examples are presented for illustrative our test purpose
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