{"id":1561,"count":1,"description":"","link":"https:\/\/eajournals.org\/ijeees\/tag\/anomaly-detection\/","name":"anomaly detection","slug":"anomaly-detection","taxonomy":"post_tag","meta":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v25.9 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>anomaly detection Archives - International Journal of Electrical and Electronics Engineering Studies (IJEEES)<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/eajournals.org\/ijeees\/tag\/anomaly-detection\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"anomaly detection Archives - International Journal of Electrical and Electronics Engineering Studies (IJEEES)\" \/>\n<meta property=\"og:url\" content=\"https:\/\/eajournals.org\/ijeees\/tag\/anomaly-detection\/\" \/>\n<meta property=\"og:site_name\" content=\"International Journal of Electrical and Electronics Engineering Studies (IJEEES)\" \/>\n<meta name=\"twitter:card\" content=\"summary_large_image\" \/>\n<script type=\"application\/ld+json\" class=\"yoast-schema-graph\">{\"@context\":\"https:\/\/schema.org\",\"@graph\":[{\"@type\":\"CollectionPage\",\"@id\":\"https:\/\/eajournals.org\/ijeees\/tag\/anomaly-detection\/\",\"url\":\"https:\/\/eajournals.org\/ijeees\/tag\/anomaly-detection\/\",\"name\":\"anomaly detection Archives - International Journal of Electrical and Electronics Engineering Studies (IJEEES)\",\"isPartOf\":{\"@id\":\"https:\/\/eajournals.org\/ijeees\/#website\"},\"breadcrumb\":{\"@id\":\"https:\/\/eajournals.org\/ijeees\/tag\/anomaly-detection\/#breadcrumb\"},\"inLanguage\":\"en-US\"},{\"@type\":\"BreadcrumbList\",\"@id\":\"https:\/\/eajournals.org\/ijeees\/tag\/anomaly-detection\/#breadcrumb\",\"itemListElement\":[{\"@type\":\"ListItem\",\"position\":1,\"name\":\"Home\",\"item\":\"https:\/\/eajournals.org\/ijeees\/\"},{\"@type\":\"ListItem\",\"position\":2,\"name\":\"anomaly detection\"}]},{\"@type\":\"WebSite\",\"@id\":\"https:\/\/eajournals.org\/ijeees\/#website\",\"url\":\"https:\/\/eajournals.org\/ijeees\/\",\"name\":\"International Journal of Electrical and Electronics Engineering Studies (IJEEES)\",\"description\":\"\",\"potentialAction\":[{\"@type\":\"SearchAction\",\"target\":{\"@type\":\"EntryPoint\",\"urlTemplate\":\"https:\/\/eajournals.org\/ijeees\/?s={search_term_string}\"},\"query-input\":{\"@type\":\"PropertyValueSpecification\",\"valueRequired\":true,\"valueName\":\"search_term_string\"}}],\"inLanguage\":\"en-US\"}]}<\/script>\n<!-- \/ Yoast SEO plugin. -->","yoast_head_json":{"title":"anomaly detection Archives - International Journal of Electrical and Electronics Engineering Studies (IJEEES)","robots":{"index":"index","follow":"follow","max-snippet":"max-snippet:-1","max-image-preview":"max-image-preview:large","max-video-preview":"max-video-preview:-1"},"canonical":"https:\/\/eajournals.org\/ijeees\/tag\/anomaly-detection\/","og_locale":"en_US","og_type":"article","og_title":"anomaly detection Archives - International Journal of Electrical and Electronics Engineering Studies (IJEEES)","og_url":"https:\/\/eajournals.org\/ijeees\/tag\/anomaly-detection\/","og_site_name":"International Journal of Electrical and Electronics Engineering Studies (IJEEES)","twitter_card":"summary_large_image","schema":{"@context":"https:\/\/schema.org","@graph":[{"@type":"CollectionPage","@id":"https:\/\/eajournals.org\/ijeees\/tag\/anomaly-detection\/","url":"https:\/\/eajournals.org\/ijeees\/tag\/anomaly-detection\/","name":"anomaly detection Archives - International Journal of Electrical and Electronics Engineering Studies (IJEEES)","isPartOf":{"@id":"https:\/\/eajournals.org\/ijeees\/#website"},"breadcrumb":{"@id":"https:\/\/eajournals.org\/ijeees\/tag\/anomaly-detection\/#breadcrumb"},"inLanguage":"en-US"},{"@type":"BreadcrumbList","@id":"https:\/\/eajournals.org\/ijeees\/tag\/anomaly-detection\/#breadcrumb","itemListElement":[{"@type":"ListItem","position":1,"name":"Home","item":"https:\/\/eajournals.org\/ijeees\/"},{"@type":"ListItem","position":2,"name":"anomaly detection"}]},{"@type":"WebSite","@id":"https:\/\/eajournals.org\/ijeees\/#website","url":"https:\/\/eajournals.org\/ijeees\/","name":"International Journal of Electrical and Electronics Engineering Studies (IJEEES)","description":"","potentialAction":[{"@type":"SearchAction","target":{"@type":"EntryPoint","urlTemplate":"https:\/\/eajournals.org\/ijeees\/?s={search_term_string}"},"query-input":{"@type":"PropertyValueSpecification","valueRequired":true,"valueName":"search_term_string"}}],"inLanguage":"en-US"}]}},"_links":{"self":[{"href":"https:\/\/eajournals.org\/ijeees\/wp-json\/wp\/v2\/tags\/1561","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/eajournals.org\/ijeees\/wp-json\/wp\/v2\/tags"}],"about":[{"href":"https:\/\/eajournals.org\/ijeees\/wp-json\/wp\/v2\/taxonomies\/post_tag"}],"wp:post_type":[{"href":"https:\/\/eajournals.org\/ijeees\/wp-json\/wp\/v2\/posts?tags=1561"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}