Thermal Annealing On the Eds and Optical Properties of Tio2/Cuo Core-Shell Thin Films (Published)
Studies of thermal annealing on the energy dispersive spectrometer (EDS) analysis and some optical properties of TiO2/CuO core-shell thin films were carried out in the visible, infrared and UV regions. In this study, the optical properties such as reflectance, absorption and extinction coefficients in relation to the annealing temperatures were particularly investigated. Results of this study showed that: the films are crystalline and contained no impurities as EDS analysis indicated, the as – deposited thin film has the lowest values of reflectance ranging from 5 – 12% within 400 – 1100nm (visible – NIR) regions. Low reflectance values of the films improved their qualities as photovoltaic materials. The sample annealed at 473K has the highest value of absorption coefficient in the UV (0.29 – 0.35mm) region. The films are good materials for UV sensors. The variations of the reflectance, absorption and extinction coefficients of the films with the annealing temperatures cannot be said to be in; a direct or any defined proportion.
Citation: Daniel U. Onah, Peter E. Agbo, Mary O. Nwodo, Rufus O. Ijeh, Edwin H. Uguru and Omeje, Conelius U.(2021) Thermal Annealing On the Eds and Optical Properties of Tio2/Cuo Core-Shell Thin Films, European Journal of Material Science , Vol.8, No.2, pp.1-9,
Keywords: EDS, Thermal annealing, absorption and extinction coefficients, reflectance