Automotive and AI platforms are placing unprecedented demands on semiconductor reliability, uptime, and fault tolerance in an era where even momentary malfunctions can lead to catastrophic consequences. Traditional Design-for-Test (DFT) and Built-In Self-Test (BIST) methods—once sufficient for manufacturing validation—have evolved into sophisticated predictive test architectures capable of anticipating and preempting failures before they manifest at the system level. These advanced frameworks represent a fundamental paradigm shift from reactive to proactive fault management, incorporating continuous monitoring capabilities that track subtle parametric shifts indicative of emerging reliability issues. Runtime diagnostics now operate transparently alongside functional workloads, leveraging idle computational resources to execute targeted validation sequences without disrupting critical operations. AI-enhanced test analytics process vast quantities of telemetry data to identify complex correlations between operational parameters and potential failure modes, often detecting precursors to hardware failures hours or days before functional manifestation. Safety-aware self-test mechanisms implement hierarchical validation strategies with graduated test intensity based on operational context, concentrating resources on high-risk scenarios while minimizing overhead during normal operation. With a focus on real-time fault detection, comprehensive health monitoring, and rigorous compliance with functional safety standards like ISO 26262, these predictive test architectures are reshaping semiconductor validation and maintenance practices across multiple industries. The integration of explainable AI techniques further enhances deployment viability by providing transparency into prediction rationales, addressing critical requirements for regulatory approval in safety-critical applications. Through sophisticated on-chip sensors, adaptive testing schedules, and intelligent fault recovery mechanisms, predictive test architectures enable mission-critical systems to maintain essential functionality even when significant hardware. degradation occurs
Keywords: AI Accelerators, Automotive SoCs, Fault Prediction, ISO 26262, In-System Monitoring, Predictive Testing, Runtime BIST, Telemetry
