This article presents an innovative framework for optimizing System-on-Chip (SoC) verification, addressing the growing challenges in modern semiconductor design. The article examines the implementation of intelligent simulation monitoring, automated coverage prediction, and adaptive test pattern generation in verification processes. Through the integration of multiple verification methodologies, including simulation-based verification, emulation platforms, and formal verification techniques, the framework demonstrates significant improvements in efficiency and coverage. The article highlights how this comprehensive approach reduces post-silicon bugs, decreases verification effort, and enhances resource utilization while maintaining quality standards. The article provides valuable insights for semiconductor companies seeking to optimize their verification processes and achieve first-pass silicon success in increasingly complex designs.
Keywords: SoC verification, coverage prediction, formal verification, simulation monitoring, verification framework
